Dielectric spectroscopy

Results: 86



#Item
21Photon Factory Activity Report 2006 #24 Part BSurface and Interface 2C/2005S2-002  Suppression of silicidation and crystallization by atmosphere controlled annealing

Photon Factory Activity Report 2006 #24 Part BSurface and Interface 2C/2005S2-002 Suppression of silicidation and crystallization by atmosphere controlled annealing

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Source URL: pfwww.kek.jp

Language: English - Date: 2010-01-05 10:33:38
22Photon Factory Activity Report 2005 #23Part BSurface and Interface 2C/2002S2-002  Annealing-temperature dependence: Mechanism of Hf silicidation in HfO2 gate

Photon Factory Activity Report 2005 #23Part BSurface and Interface 2C/2002S2-002 Annealing-temperature dependence: Mechanism of Hf silicidation in HfO2 gate

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Source URL: pfwww.kek.jp

Language: English - Date: 2010-01-05 10:32:21
23Photon Factory Activity Report 2008 #26 Part BSurface and Interface 2C/2008S2-003 Effects of thermal annealing on charge density and N chemical states in HfSiON films studied by photoemission spectroscopy

Photon Factory Activity Report 2008 #26 Part BSurface and Interface 2C/2008S2-003 Effects of thermal annealing on charge density and N chemical states in HfSiON films studied by photoemission spectroscopy

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Source URL: pfwww.kek.jp

Language: English - Date: 2010-01-05 10:36:05
24Photon Factory Activity Report 2004 #22 Part BSurface and Interface 2C/2002S2-002  Crystallization in HfO2 gate insulators with in situ annealing

Photon Factory Activity Report 2004 #22 Part BSurface and Interface 2C/2002S2-002 Crystallization in HfO2 gate insulators with in situ annealing

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Source URL: pfwww.kek.jp

Language: English - Date: 2010-01-05 10:31:27
25Photon Factory Activity Report 2007 #25 Part BElectronic Structure of Condensed Matter 2C/2005S2-002  Depth profiling of chemical states and charge density in HfSiON by

Photon Factory Activity Report 2007 #25 Part BElectronic Structure of Condensed Matter 2C/2005S2-002 Depth profiling of chemical states and charge density in HfSiON by

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Source URL: pfwww.kek.jp

Language: English - Date: 2010-01-05 10:34:55
26Photon Factory Activity Report 2004 #22 Part BSurface and Interface 2C/2002S2-002  Interfacial reaction of polycrystalline-Si /HfO2/Si gate stacks with annealing

Photon Factory Activity Report 2004 #22 Part BSurface and Interface 2C/2002S2-002 Interfacial reaction of polycrystalline-Si /HfO2/Si gate stacks with annealing

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Source URL: pfwww.kek.jp

Language: English - Date: 2010-01-05 10:31:28
27Visualisation of cerebrospinal fluid flow patterns in albino Xenopus larvae in vivo

Visualisation of cerebrospinal fluid flow patterns in albino Xenopus larvae in vivo

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Source URL: www.fluidsbarrierscns.com

Language: English
28Reliability Digest, FebruaryFuel Cells Impedance Estimation Using Regression Analysis Wlamir Olivares Loesch Vianna, Ivo Paixão de Medeiros,

Reliability Digest, FebruaryFuel Cells Impedance Estimation Using Regression Analysis Wlamir Olivares Loesch Vianna, Ivo Paixão de Medeiros,

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Source URL: rs.ieee.org

Language: English - Date: 2015-03-26 07:58:59
29egu_logo_without_circle_grey

egu_logo_without_circle_grey

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Source URL: www.the-cryosphere.net

Language: English - Date: 2014-12-04 08:27:22
30Microsoft Word - extabstract QS2006 bisquert.doc

Microsoft Word - extabstract QS2006 bisquert.doc

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Source URL: www.quantsol.org

Language: English - Date: 2010-05-11 12:44:16